Lam Ta
Professional Experience
Forty-five years of hands-on experience in Semiconductror Technology R&D, Design, Test, Device/Process Integration, Product Engineering, Wafer Fab, Assembly, and Failure Analyses. Successfully led teams to develop new technologies and products resulting in very high-volume production of several generations of microcontrollers. Have worked at Motorola, Harris Semiconductor, AT&T Microelectronics, SEMATECH, Freescale Semiconductor, NXP Semiconductor. Distinguished Member of Technical Staff (DMTS) at Freescale, Technical Director at NXP.
Professional Publications
PATENTS AWARDED:
* Automatic High-speed Tristate Buffer (co-inventor)
* Low-power, Compact CMOS Comparator (co-inventor)
PUBLICATIONS (sample):
* Deployment of Custom Algorithms for Very High-Volume Quality Control, Yield Diagnostics, and Equipment Monitoring, International Test Conference Data-2014 Workshop (Co-author).
* MRAM Preps for Role in Embedded Memory, EE Times April 2007 (Co-author). Article was translated into several languages.
* The Effect of PVD Ti Film Thickness and TiSi2 Interlayer Formation on the Stress of the Bonding Pad Poly Glue Layer, VMIC Conference, June, 97. (Co-author)
* Motorola Defensive Publication: Self-aligned Late NOR-Type ROM Programming Utilizing LDD Implant (Apr 97)
* A 0.25um Fully Planarized CMOS Technology, ESSDERC 1993 (Co-author)
* An Advanced, Scaled Backend of the Line Dielectric Isolation Process, VMIC 1993. (Co-author)
Published: January 24, 2026